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Reliability and Failure of Electronic Materials and Devices / Milton Ohring / Buch / Englisch / Academic Press / EAN 9780125249850 - Ohring, Milton
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Ohring, Milton:

Reliability and Failure of Electronic Materials and Devices / Milton Ohring / Buch / Englisch / Academic Press / EAN 9780125249850 - neues Buch

ISBN: 9780125249850

[PU: Academic Press], Suitable as a reference work for reliability professionals or as a text for advanced undergraduate or graduate students, this book introduces the reader to the widel… Mehr…

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Milton Ohring:

Reliability and Failure of Electronic Materials and Devices, - gebunden oder broschiert

1998, ISBN: 9780125249850

Hardcover, Neubuch, BRAND NEW BOOK! Shipped within 24-48 hours. Normal delivery time is 5-12 days. Please note some orders may be shipped from UK with same delivery timeframe, ***NO EXPED… Mehr…

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Ohring, Milton:
Reliability and Failure of Electronic Materials and Devices - gebunden oder broschiert

ISBN: 9780125249850

Academic Press, 1998-06-12. Hardcover. New. New. In shrink wrap. Looks like an interesting title!, Academic Press, 1998-06-12, 6

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Ohring, Milton:
Reliability and Failure of Electronic Materials and Devices - gebunden oder broschiert

1998, ISBN: 0125249853

[EAN: 9780125249850], Neubuch, [PU: Academic Press], Brand New Copy, Books

NEW BOOK. Versandkosten: EUR 27.22 Big Bill's Books, Austin, TX, U.S.A. [74145536] [Rating: 5 (von 5)]
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Reliability and Failure of Electronic Materials and Devices
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Titel:
ISBN-Nummer:

9780125249850


Suitable as a reference work for reliability professionals or as a text for advanced undergraduate or graduate students, this book introduces the reader to the widely dispersed reliability literature of microelectronic and electronic-optional devices. Reliability and Failure of Electronic Materials and Devices integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation, and the statistical handling of lifetime data. Electromigration, dielectric radiation damage and the mechanical failure of contacts and solder joints are among the failure mechanisms considered. An underlying thread of the book concerns product defects--their relation to yield and reliability, the role they play in failure, and the way they are experimentally exposed.<BR>The reader will gain a deeper physical understanding of failure mechanisms in electronic materials and devices, acquire skills in the mathematical handling of reliability data, and better appreciate future technology trends and the reliability issues they raise. <BR>Key Features<BR>* Discusses reliability and failure on both the chip and packaging levels<BR>* Handles the role of defects in yield and reliability<BR>* Includes a tutorial chapter on the mathematics of reliability<BR>* Focuses on electromigration, dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, radiation damage and the mechanical failure of packages, contacts, and solder joints<BR>* Considers defect detection methods and failure analysis techniques

Detailangaben zum Buch - Reliability and Failure of Electronic Materials and Devices


EAN (ISBN-13): 9780125249850
ISBN (ISBN-10): 0125249853
Gebundene Ausgabe
Erscheinungsjahr: 1998
Herausgeber: Academic Press
692 Seiten
Gewicht: 1,102 kg
Sprache: eng/Englisch

Buch in der Datenbank seit 2007-08-13T04:47:35+02:00 (Zurich)
Detailseite zuletzt geändert am 2024-01-26T11:08:31+01:00 (Zurich)
ISBN/EAN: 9780125249850

ISBN - alternative Schreibweisen:
0-12-524985-3, 978-0-12-524985-0
Alternative Schreibweisen und verwandte Suchbegriffe:
Autor des Buches: ohring, milton, ohr, ohrin
Titel des Buches: failure materials, reliability, devices wonder, ohrringe, electronic materials and devices

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