Analysis and Design of Resilient VLSI Circuits : Mitigating Soft Errors and Process Variations - neues Buch
ISBN: 9781441909312
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes.The reliable operation of integrated circuits (ICs) has become increasingly… Mehr…
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ISBN: 9781441909312
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingl… Mehr…
Springer.com Nr. 978-1-4419-0931-2. Versandkosten:Worldwide free shipping, , DE. (EUR 0.00) Details... |
Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations - neues Buch
2009, ISBN: 9781441909312
Springer, Kindle Edition, Auflage: 2010, 234 Seiten, Publiziert: 2009-10-22T00:00:00.000Z, Produktgruppe: Digital Ebook Purchas, Verkaufsrang: 3939836, Drafting & Presentation, Architectu… Mehr…
amazon.com |
Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations - neues Buch
2009, ISBN: 9781441909312
Springer, Kindle Edition, Auflage: 2010, 234 Seiten, Publiziert: 2009-10-22T00:00:00.000Z, Produktgruppe: Digital Ebook Purchas, Computer Aided Design, Graphics & Multimedia, Software & G… Mehr…
amazon.co.uk |
Analysis and Design of Resilient VLSI Circuits : Mitigating Soft Errors and Process Variations - neues Buch
ISBN: 9781441909312
VLSI design has grown more challenging due to detrimental effects of radiation particle strikes and processing variations. This book describes the design of resilient VLSI circuits, prese… Mehr…
hive.co.uk No. 9781441909312. Versandkosten:Instock, Despatched same working day before 3pm, plus shipping costs., zzgl. Versandkosten Details... |
Analysis and Design of Resilient VLSI Circuits : Mitigating Soft Errors and Process Variations - neues Buch
ISBN: 9781441909312
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes.The reliable operation of integrated circuits (ICs) has become increasingly… Mehr…
ISBN: 9781441909312
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingl… Mehr…
Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations - neues Buch
2009
ISBN: 9781441909312
Springer, Kindle Edition, Auflage: 2010, 234 Seiten, Publiziert: 2009-10-22T00:00:00.000Z, Produktgruppe: Digital Ebook Purchas, Verkaufsrang: 3939836, Drafting & Presentation, Architectu… Mehr…
Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations - neues Buch
2009, ISBN: 9781441909312
Springer, Kindle Edition, Auflage: 2010, 234 Seiten, Publiziert: 2009-10-22T00:00:00.000Z, Produktgruppe: Digital Ebook Purchas, Computer Aided Design, Graphics & Multimedia, Software & G… Mehr…
Analysis and Design of Resilient VLSI Circuits : Mitigating Soft Errors and Process Variations - neues Buch
ISBN: 9781441909312
VLSI design has grown more challenging due to detrimental effects of radiation particle strikes and processing variations. This book describes the design of resilient VLSI circuits, prese… Mehr…
Bibliographische Daten des bestpassenden Buches
Detailangaben zum Buch - Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations
EAN (ISBN-13): 9781441909312
ISBN (ISBN-10): 1441909311
Erscheinungsjahr: 2009
Herausgeber: Springer
212 Seiten
Sprache: eng/Englisch
Buch in der Datenbank seit 2010-09-08T21:13:02+02:00 (Zurich)
Detailseite zuletzt geändert am 2023-09-12T19:47:23+02:00 (Zurich)
ISBN/EAN: 9781441909312
ISBN - alternative Schreibweisen:
1-4419-0931-1, 978-1-4419-0931-2
Alternative Schreibweisen und verwandte Suchbegriffe:
Autor des Buches: sunil, garg
Titel des Buches: vlsi, circuit analysis, analysis and design circuits
Daten vom Verlag:
Autor/in: Rajesh Garg
Titel: Analysis and Design of Resilient VLSI Circuits - Mitigating Soft Errors and Process Variations
Verlag: Springer; Springer US
212 Seiten
Erscheinungsjahr: 2009-10-22
New York; NY; US
Sprache: Englisch
106,99 € (DE)
110,00 € (AT)
130,00 CHF (CH)
Available
XXII, 212 p.
EA; E107; eBook; Nonbooks, PBS / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Crosstalk; EDA; Power Supply Variation; Radiation Effects; Resilient VLSI Design; Soft Errors; VLSI; VLSI Design; algorithms; circuit design; design automation; electronic design automation; modeling; simulation; stability; B; Electronic Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Engineering; Computer-Aided Design (CAD); BB
This book is motivated by the challenges faced in designing reliable integratedsystems using modern VLSI processes. The reliable operation of Integrated Circuits (ICs) has become increasingly difficult to achieve in the deep sub-micron (DSM) era. With continuously decreasing device feature sizes, combined with lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations and radiation-induced soft errors.This book describes the design of resilient VLSI circuits. It presents algorithms to analyze the detrimental effects of radiation particle strikes and processing variations on the electrical behavior of VLSI circuits, as well as circuit design techniques to mitigate the impact of these problems. Describes the state of the art in the areas of radiation tolerant circuit design and process variation tolerant circuit design; Presents analytical approaches to test efficiently the severity of electrical effects of radiation/process variations, as well as techniques to minimize the effects due to these two problems; Distills content oriented toward nuclear engineers into leading-edge algorithms and techniques that can be understood easily and applied by VLSI designers.Describes the state of the art in the areas of radiation tolerance circuit design and process variation tolerant circuit design Presents analytical approaches to test efficiently the severity of electrical effects of radiation/process variations, as well as techniques to minimize the effects due to these two problems Distills content oriented toward nuclear engineers into leading-edge algorithms and techniques that can be understood easily and applied by VLSI designers Includes supplementary material: sn.pub/extras
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