ISBN: 3642623336
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[EAN: 9783642623332], Neubuch, [SC: 0.0], [PU: Springer Berlin Heidelberg], CRYSTALGROWTH; HELIUM-ATOM-STREUUNG; PES; SILICONCARBIDE; TRANSMISSION; CRYSTAL; DIFFRACTION; ELECTRONMICROSCOP… Mehr…
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Softcover reprint of the original 1st ed. 2004 Kartoniert / Broschiert Materialwissenschaft / Aggregatzustände, Optische Physik, Materialwissenschaft, Werkstoffprüfung, Elektronik, Elek… Mehr…
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Recent Major Advances, Softcover reprint of the original 1st ed. 2004, Softcover, Buch, [PU: Springer Berlin]
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ISBN: 3642623336
Taschenbuch, [EAN: 9783642623332], Springer, Springer, Book, [PU: Springer], Springer, Since the 1997 publication of "Silicon Carbide - A Review of Fundamental Questions and Applications … Mehr…
ISBN: 9783642623332
Since the 1997 publication of "Silicon Carbide - A Review of Fundamental Questions and Applications to Current Device Technology" edited by Choyke, et al., there has been impressive progr… Mehr…
2012
ISBN: 3642623336
[EAN: 9783642623332], Neubuch, [SC: 0.0], [PU: Springer Berlin Heidelberg], CRYSTALGROWTH; HELIUM-ATOM-STREUUNG; PES; SILICONCARBIDE; TRANSMISSION; CRYSTAL; DIFFRACTION; ELECTRONMICROSCOP… Mehr…
2012, ISBN: 3642623336
Softcover reprint of the original 1st ed. 2004 Kartoniert / Broschiert Materialwissenschaft / Aggregatzustände, Optische Physik, Materialwissenschaft, Werkstoffprüfung, Elektronik, Elek… Mehr…
2012, ISBN: 9783642623332
Recent Major Advances, Softcover reprint of the original 1st ed. 2004, Softcover, Buch, [PU: Springer Berlin]
Bibliographische Daten des bestpassenden Buches
Autor: | |
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Since the 1997 publication of "Silicon Carbide - A Review of Fundamental Questions and Applications to Current Device Technology" edited by Choyke, et al., there has been impressive progress in both the fundamental and developmental aspects of the SiC field. So there is a growing need to update the scientific community on the important events in research and development since then. The editors have again gathered an outstanding team of the world's leading SiC researchers and design engineers to write on the most recent developments in SiC.
Detailangaben zum Buch - Silicon Carbide
EAN (ISBN-13): 9783642623332
ISBN (ISBN-10): 3642623336
Gebundene Ausgabe
Taschenbuch
Erscheinungsjahr: 2012
Herausgeber: Springer Berlin
Buch in der Datenbank seit 2014-03-13T16:21:45+01:00 (Zurich)
Detailseite zuletzt geändert am 2021-11-29T15:30:25+01:00 (Zurich)
ISBN/EAN: 9783642623332
ISBN - alternative Schreibweisen:
3-642-62333-6, 978-3-642-62333-2
Alternative Schreibweisen und verwandte Suchbegriffe:
Autor des Buches: gerhard wolf, penß, matsunami, gerhard wöl, choyke
Titel des Buches: silicon carbide
Daten vom Verlag:
Autor/in: Wolfgang J. Choyke; Hiroyuki Matsunami; Gerhard Pensl
Titel: Advanced Texts in Physics; Silicon Carbide - Recent Major Advances
Verlag: Springer; Springer Berlin
899 Seiten
Erscheinungsjahr: 2012-12-07
Berlin; Heidelberg; DE
Gedruckt / Hergestellt in Niederlande.
Sprache: Englisch
320,99 € (DE)
329,99 € (AT)
354,00 CHF (CH)
POD
XXXIV, 899 p.
BC; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Elektronik; Verstehen; Crystal growth; Helium-Atom-Streuung; PES; Silicon carbide; Transmission; crystal; diffraction; electron microscopy; microscopy; semiconductor; spectroscopy; thin film; thin films; transmission electron microscopy; Electronics and Microelectronics, Instrumentation; Optical Materials; Characterization and Analytical Technique; Surfaces, Interfaces and Thin Film; Condensed Matter Physics; Laser; Technische Anwendung von elektronischen, magnetischen, optischen Materialien; Werkstoffprüfung; Materialwissenschaft; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Laserphysik; BB; EA
Zero- and Two-Dimensional Native Defects.- Defect Migration and Annealing Mechanisms.- Hydrogen in SiC.- Electronic Properties of Stacking Faults and Thin Cubic Inclusions in SiC Polytypes.- Principles and Limitations of Numerical Simulation of SiC Boule Growth by Sublimation.- Defect Formation and Reduction During Bulk SiC Growth.- High Nitrogen Doping During Bulk Growth of SiC.- Homoepitaxial and Heteroepitaxial Growth on Step-Free SiC Mesas.- Low-Defect 3C-SiC Grown on Undulant-Si (001) Substrates.- New Development in Hot Wall Vapor Phase Epitaxial Growth of Silicon Carbide.- Formation of SiC Thin Films by Ion Beam Synthesis.- Atomic Structure of SiC Surfaces.- The Continuum of Interface-Induced Gap States — The Unifying Concept of the Band Lineup at Semiconductor Interfaces — Application to Silicon Carbide.- Contributions to the Density of Interface States in SiC MOS Structures.- Properties of Nitrided Oxides on SiC.- Hall Effect Studies of Electron Mobility and Trapping at the SiC/SiO2 Interface.- Optical Properties of SiC: 1997–2002.- Cyclotron Resonance Studies of Effective Masses and Band Structure in SiC.- Electronic Structure of Deep Defects in SiC.- Phosphorus-Related Centers in SiC.- Hall Scattering Factor for Electrons and Holes in SiC.- Radiotracer Deep Level Transient Spectroscopy.- Vacancy Defects Detected by Positron Annihilatio.- Characterization of Defects in SiC Crystals by Raman Scattering.- Characterization of Low-Dimensional Structures in SiC Using Advanced Transmission Electron Microscopy.- Synchrotron White Beam X-Ray Topography and High Resolution X-Ray Diffraction Studies of Defects in SiC Substrates, Epilayers and Device Structures.- Ohmic Contacts for Power Devices on SiC.- Micromachining of SiC.- Surface Preparation Techniques for SiCWafers.- Epitaxial Growth and Device Processing of SiC on Non-Basal Planes.- SiC Power Bipolar Transistors and Thyristors.- High Voltage SiC Devices.- Power MOSFETs in 4H-SiC: Device Design and Technology.- Normally-Off Accumulation-Mode Epi-Channel Field Effect Transistor.- Development of SiC Devices for Microwave and RF Power Amplifiers.- Advances in SiC Field Effect Gas Sensors.SiC is an important new material for power electronics, a substrate for GaN devices and even a blue-light-emitting semiconductor The top level of SiC research is presented in this book Includes supplementary material: sn.pub/extras
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9783540404583 Silicon Carbide (Wolfgang J. Choyke)
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