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Point Defects in Semiconductors I: Theoretical Aspects - Taschenbuch

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Point Defects in Semiconductors I - Taschenbuch

2012, ISBN: 3642815766

[EAN: 9783642815768], Neubuch, [PU: Springer Berlin Heidelberg], GITTERFEHLER HALBLEITER BANDSTRUCTURE BANDTHEORY CRYSTAL CRYSTALSTRUCTURE CRYSTALLOGRAPHICDEFECT DIFFUSION ELECTRON ELECTR… Mehr…

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M. Lannoo:
Point Defects in Semiconductors I - Taschenbuch

2012, ISBN: 9783642815768

Theoretical Aspects, Buch, Softcover, Softcover reprint of the original 1st ed. 1981, [PU: Springer Berlin], Springer Berlin, 2012

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Point Defects in Semiconductors I: Theoretical Aspects M. Lannoo Author

From its early beginning before the war, the field of semiconductors has developped as a classical example where the standard approximations of 'band theory' can be safely used to study its interesting electronic properties. Thus in these covalent crystals, the electronic structure is only weakly coupled with the atomic vibrations; one-electron Bloch functions can be used and their energy bands can be accurately computed in the neighborhood of the energy gap between the valence and conduction bands; nand p doping can be obtained by introducing substitutional impurities which only introduce shallow donors and acceptors and can be studied by an effective-mass weak-scattering description. Yet, even at the beginning, it was known from luminescence studies that these simple concepts failed to describe the various 'deep levels' introduced near the middle of the energy gap by strong localized imperfections. These imperfections not only include some interstitial and many substitutional atoms, but also 'broken bonds' associated with surfaces and interfaces, dis- location cores and 'vacancies', i.e., vacant iattice sites in the crystal. In all these cases, the electronic structure can be strongly correlated with the details of the atomic structure and the atomic motion. Because these 'deep levels' are strongly localised, electron-electron correlations can also playa significant role, and any weak perturbation treatment from the perfect crystal structure obviously fails. Thus, approximate 'strong coupling' techniques must often be used, in line' with a more chemical de- scription of bonding.

Detailangaben zum Buch - Point Defects in Semiconductors I: Theoretical Aspects M. Lannoo Author


EAN (ISBN-13): 9783642815768
ISBN (ISBN-10): 3642815766
Taschenbuch
Erscheinungsjahr: 2012
Herausgeber: Springer Berlin Heidelberg Core >1

Buch in der Datenbank seit 2014-09-13T11:27:47+02:00 (Zurich)
Detailseite zuletzt geändert am 2024-02-13T23:16:51+01:00 (Zurich)
ISBN/EAN: 3642815766

ISBN - alternative Schreibweisen:
3-642-81576-6, 978-3-642-81576-8
Alternative Schreibweisen und verwandte Suchbegriffe:
Autor des Buches: friedel, lannoo
Titel des Buches: semiconductors, point, springer series solid state sciences


Daten vom Verlag:

Autor/in: M. Lannoo
Titel: Springer Series in Solid-State Sciences; Point Defects in Semiconductors I - Theoretical Aspects
Verlag: Springer; Springer Berlin
265 Seiten
Erscheinungsjahr: 2012-01-10
Berlin; Heidelberg; DE
Gedruckt / Hergestellt in Niederlande.
Sprache: Englisch
53,49 € (DE)
54,99 € (AT)
59,00 CHF (CH)
POD
XVII, 265 p.

BC; Hardcover, Softcover / Technik/Maschinenbau, Fertigungstechnik; Werkstoffprüfung; Verstehen; Gitterfehler; Halbleiter; band structure; band theory; crystal; crystal structure; crystallographic defect; diffusion; electron; electron correlations; long-range interaction; molecule; scattering; semiconductor; Crystallography and Scattering Methods; BB

Content.- 1. Atomic Configuration of Point Defects.- 1.1 Definition of Point Defects.- 1.2 Geometrical Configuration of Point Defects.- 1.3 Lattice Distortion and Relaxation.- 1.4 Defect Symmetry and Group Theory.- 1.5 Experimental Determination of Defect Symmetry.- 2. Effective Mass Theory.- 2.1 Simplified Presentation.- 2.2 Derivation in the One-Band Case.- 2.3 Pairing Effects.- 2.4 Experimental Observation of Shallow Levels.- 3. Simpte Theory of Deep Levels in Semiaonductors.- 3.1 The Elementary Tight-Binding Theory of Defects.- 3.2 Green’s Function Theory of Defects: Tight Binding Application.- 4. Many-Electron Effects and Sophisticated Theories of Deep Levels.- 4.1 One-Electron Self-Consistent Calculations.- 4.2 Many-electron effects. The configuration interaction.- 5. Vibrational Properties and Entropy.- 5. 1 Vibrational Modes.- 5.2 Localized Modes Due to Defects.- 5.3 Experimental Determination of Vibrational Modes.- 5.4 Vibrational Entropy.- 6. Thermodynamics of Defects.- 6.1 Enthalpy of Formation.- 6.2 Defect Concentration at Thermal Equilibrium.- 6.3 On the Nature of the Defects Present at Thermal Equilibrium.- 6.4 Experimental Determination of Enthalpies.- 6.5 The Statistical Distribution of Donor-Acceptor Pairs.- 7. Defect Migration and Diffusion.- 7.1 Jump Probability and Migration Energy.- 7.2 Experimental Determination of Migration Enthalpies.- 7.3 Charge-State Effects on Defect Migration.- 7.4 Diffusion.- References.

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